X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan

Research article (IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2021) · cited 10× · AI/ML
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X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan

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X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan is a scholarly article[1].

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  • X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan's instance of is recorded as scholarly article[2].

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APA 4ort.xyz Knowledge Graph. (2026). X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan. Retrieved May 24, 2026, from https://4ort.xyz/entity/x-tolerant-compactor-maxpress-for-in-system-test-applications-with-observation-scan
MLA “X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/x-tolerant-compactor-maxpress-for-in-system-test-applications-with-observation-scan.
BibTeX @misc{4ortxyz_x-tolerant-compactor-maxpress-for-in-system-test-applications-with-observation-scan_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan}}, year = {2026}, url = {https://4ort.xyz/entity/x-tolerant-compactor-maxpress-for-in-system-test-applications-with-observation-scan}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan — https://4ort.xyz/entity/x-tolerant-compactor-maxpress-for-in-system-test-applications-with-observation-scan (retrieved 2026-05-24)

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