Two planar polishing methods by using FIB technique: Toward ultimate top-down delayering for failure analysis

Research article (AIP Advances, 2015) · cited 15× · AI/ML
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Two planar polishing methods by using FIB technique: Toward ultimate top-down delayering for failure analysis

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Two planar polishing methods by using FIB technique: Toward ultimate top-down delayering for failure analysis is a scholarly article[1].

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  • Two planar polishing methods by using FIB technique: Toward ultimate top-down delayering for failure analysis's instance of is recorded as scholarly article[2].

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APA 4ort.xyz Knowledge Graph. (2026). Two planar polishing methods by using FIB technique: Toward ultimate top-down delayering for failure analysis. Retrieved May 24, 2026, from https://4ort.xyz/entity/two-planar-polishing-methods-by-using-fib-technique-toward-ultimate-top-down-delayering-for-failure-analysis
MLA “Two planar polishing methods by using FIB technique: Toward ultimate top-down delayering for failure analysis.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/two-planar-polishing-methods-by-using-fib-technique-toward-ultimate-top-down-delayering-for-failure-analysis.
BibTeX @misc{4ortxyz_two-planar-polishing-methods-by-using-fib-technique-toward-ultimate-top-down-delayering-for-failure-analysis_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Two planar polishing methods by using FIB technique: Toward ultimate top-down delayering for failure analysis}}, year = {2026}, url = {https://4ort.xyz/entity/two-planar-polishing-methods-by-using-fib-technique-toward-ultimate-top-down-delayering-for-failure-analysis}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Two planar polishing methods by using FIB technique: Toward ultimate top-down delayering for failure analysis — https://4ort.xyz/entity/two-planar-polishing-methods-by-using-fib-technique-toward-ultimate-top-down-delayering-for-failure-analysis (retrieved 2026-05-24)

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