Test Time and Area Optimized BrST Scheme for Automotive ICs

Research article (2019 IEEE International Test Conference (ITC), 2019) · cited 12× · AI/ML
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Test Time and Area Optimized BrST Scheme for Automotive ICs

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Test Time and Area Optimized BrST Scheme for Automotive ICs is a scholarly article[1].

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  • Test Time and Area Optimized BrST Scheme for Automotive ICs's instance of is recorded as scholarly article[2].

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APA 4ort.xyz Knowledge Graph. (2026). Test Time and Area Optimized BrST Scheme for Automotive ICs. Retrieved May 24, 2026, from https://4ort.xyz/entity/test-time-and-area-optimized-brst-scheme-for-automotive-ics
MLA “Test Time and Area Optimized BrST Scheme for Automotive ICs.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/test-time-and-area-optimized-brst-scheme-for-automotive-ics.
BibTeX @misc{4ortxyz_test-time-and-area-optimized-brst-scheme-for-automotive-ics_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Test Time and Area Optimized BrST Scheme for Automotive ICs}}, year = {2026}, url = {https://4ort.xyz/entity/test-time-and-area-optimized-brst-scheme-for-automotive-ics}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Test Time and Area Optimized BrST Scheme for Automotive ICs — https://4ort.xyz/entity/test-time-and-area-optimized-brst-scheme-for-automotive-ics (retrieved 2026-05-24)

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