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Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy

Research article (Journal of Visualized Experiments, 2019) · cited 15× · AI/ML
academia openalex:W2966948571
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Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy

Summary

Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy is a scholarly article[1].

Key Facts

  • Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy's instance of is recorded as scholarly article[2].

References

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Direct Wikidata claims

  1. [2] ↑ . wikidata.org.

Class ancestry

  1. [1] ↑ . Wikidata. wikidata.org.

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APA 4ort.xyz Knowledge Graph. (2026). Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy. Retrieved May 24, 2026, from https://4ort.xyz/entity/targeted-studies-using-serial-block-face-and-focused-ion-beam-scan-electron-microscopy
MLA “Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/targeted-studies-using-serial-block-face-and-focused-ion-beam-scan-electron-microscopy.
BibTeX @misc{4ortxyz_targeted-studies-using-serial-block-face-and-focused-ion-beam-scan-electron-microscopy_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy}}, year = {2026}, url = {https://4ort.xyz/entity/targeted-studies-using-serial-block-face-and-focused-ion-beam-scan-electron-microscopy}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy — https://4ort.xyz/entity/targeted-studies-using-serial-block-face-and-focused-ion-beam-scan-electron-microscopy (retrieved 2026-05-24)

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