Sub-nanometer resolution XPS depth profiling: Sensing of atoms

Research article (Applied Surface Science, 2017) · cited 17× · AI/ML
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Sub-nanometer resolution XPS depth profiling: Sensing of atoms

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Sub-nanometer resolution XPS depth profiling: Sensing of atoms is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Sub-nanometer resolution XPS depth profiling: Sensing of atoms. Retrieved May 24, 2026, from https://4ort.xyz/entity/sub-nanometer-resolution-xps-depth-profiling-sensing-of-atoms
MLA “Sub-nanometer resolution XPS depth profiling: Sensing of atoms.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/sub-nanometer-resolution-xps-depth-profiling-sensing-of-atoms.
BibTeX @misc{4ortxyz_sub-nanometer-resolution-xps-depth-profiling-sensing-of-atoms_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Sub-nanometer resolution XPS depth profiling: Sensing of atoms}}, year = {2026}, url = {https://4ort.xyz/entity/sub-nanometer-resolution-xps-depth-profiling-sensing-of-atoms}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Sub-nanometer resolution XPS depth profiling: Sensing of atoms — https://4ort.xyz/entity/sub-nanometer-resolution-xps-depth-profiling-sensing-of-atoms (retrieved 2026-05-24)

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