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STM patterned nanowire measurements using photolithographically defined implants in Si(100)

Research article (Scientific Reports, 2018) · cited 15× · AI/ML
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STM patterned nanowire measurements using photolithographically defined implants in Si(100)

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STM patterned nanowire measurements using photolithographically defined implants in Si(100) is a scholarly article[1].

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  • STM patterned nanowire measurements using photolithographically defined implants in Si(100)'s instance of is recorded as scholarly article[2].

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APA 4ort.xyz Knowledge Graph. (2026). STM patterned nanowire measurements using photolithographically defined implants in Si(100). Retrieved May 24, 2026, from https://4ort.xyz/entity/stm-patterned-nanowire-measurements-using-photolithographically-defined-implants-in-si-100
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BibTeX @misc{4ortxyz_stm-patterned-nanowire-measurements-using-photolithographically-defined-implants-in-si-100_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{STM patterned nanowire measurements using photolithographically defined implants in Si(100)}}, year = {2026}, url = {https://4ort.xyz/entity/stm-patterned-nanowire-measurements-using-photolithographically-defined-implants-in-si-100}, note = {Accessed: 2026-05-24}}
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