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semiconductor device reliability

reliability of semiconductor-based electronic components
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semiconductor device reliability

Summary

Key Facts

  • semiconductor device reliability's subclass of is recorded as reliability[1].
  • semiconductor device reliability's Freebase ID is recorded as /m/051xsx7[2].
  • semiconductor device reliability's facet of is recorded as semiconductor device[3].
  • semiconductor device reliability's Microsoft Academic ID is recorded as 43214815[4].
  • semiconductor device reliability's OpenAlex ID is recorded as C43214815[5].

References

Programmatic citations — every numbered marker resolves to a verifiable graph row below.

Direct Wikidata claims

  1. [1] ↑ . wikidata.org.
  2. [2] ↑ . wikidata.org.
  3. [3] ↑ . wikidata.org.
  4. [4] ↑ . wikidata.org.
  5. [5] ↑ . OpenAlex. Retrieved . docs.openalex.org. Provenance: wikidata.org.

📑 Cite this page

Use these citations when quoting this entity in research, articles, AI prompts, or wherever provenance matters. We aggregate Wikidata + Wikipedia + authoritative open-data sources; the stitched, scored, cross-referenced view is what 4ort.xyz contributes.

APA 4ort.xyz Knowledge Graph. (2026). semiconductor device reliability. Retrieved May 7, 2026, from https://4ort.xyz/entity/semiconductor-device-reliability
MLA “semiconductor device reliability.” 4ort.xyz Knowledge Graph, 4ort.xyz, 7 May. 2026, https://4ort.xyz/entity/semiconductor-device-reliability.
BibTeX @misc{4ortxyz_semiconductor-device-reliability_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{semiconductor device reliability}}, year = {2026}, url = {https://4ort.xyz/entity/semiconductor-device-reliability}, note = {Accessed: 2026-05-07}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): semiconductor device reliability — https://4ort.xyz/entity/semiconductor-device-reliability (retrieved 2026-05-07)

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