Semi-supervised Wafer Map Pattern Recognition using Domain-Specific Data Augmentation and Contrastive Learning

Research article (2021 IEEE International Test Conference (ITC), 2021) · cited 15× · AI/ML
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Semi-supervised Wafer Map Pattern Recognition using Domain-Specific Data Augmentation and Contrastive Learning

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Semi-supervised Wafer Map Pattern Recognition using Domain-Specific Data Augmentation and Contrastive Learning is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Semi-supervised Wafer Map Pattern Recognition using Domain-Specific Data Augmentation and Contrastive Learning. Retrieved May 24, 2026, from https://4ort.xyz/entity/semi-supervised-wafer-map-pattern-recognition-using-domain-specific-data-augmentation-and-contrastive-learning
MLA “Semi-supervised Wafer Map Pattern Recognition using Domain-Specific Data Augmentation and Contrastive Learning.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/semi-supervised-wafer-map-pattern-recognition-using-domain-specific-data-augmentation-and-contrastive-learning.
BibTeX @misc{4ortxyz_semi-supervised-wafer-map-pattern-recognition-using-domain-specific-data-augmentation-and-contrastive-learning_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Semi-supervised Wafer Map Pattern Recognition using Domain-Specific Data Augmentation and Contrastive Learning}}, year = {2026}, url = {https://4ort.xyz/entity/semi-supervised-wafer-map-pattern-recognition-using-domain-specific-data-augmentation-and-contrastive-learning}, note = {Accessed: 2026-05-24}}
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