Secondary Electron Imaging in an Aberration-Corrected STEM

Research article (Microscopy Today, 2016) · cited 18× · AI/ML
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Secondary Electron Imaging in an Aberration-Corrected STEM

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Secondary Electron Imaging in an Aberration-Corrected STEM is a scholarly article[1].

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  • Secondary Electron Imaging in an Aberration-Corrected STEM's instance of is recorded as scholarly article[2].

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APA 4ort.xyz Knowledge Graph. (2026). Secondary Electron Imaging in an Aberration-Corrected STEM. Retrieved May 24, 2026, from https://4ort.xyz/entity/secondary-electron-imaging-in-an-aberration-corrected-stem
MLA “Secondary Electron Imaging in an Aberration-Corrected STEM.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/secondary-electron-imaging-in-an-aberration-corrected-stem.
BibTeX @misc{4ortxyz_secondary-electron-imaging-in-an-aberration-corrected-stem_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Secondary Electron Imaging in an Aberration-Corrected STEM}}, year = {2026}, url = {https://4ort.xyz/entity/secondary-electron-imaging-in-an-aberration-corrected-stem}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Secondary Electron Imaging in an Aberration-Corrected STEM — https://4ort.xyz/entity/secondary-electron-imaging-in-an-aberration-corrected-stem (retrieved 2026-05-24)

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