Scanning Electron Microscopy

Summary

Scanning Electron Microscopy is a scientific journal^[1].

Key Facts

• Scanning Electron Microscopy's instance of is recorded as scientific journal^[2].
• Scanning Electron Microscopy's VIAF cluster ID is recorded as 150810500^[3].
• Scanning Electron Microscopy's ISSN is recorded as 0586-5581^[4].
• Scanning Electron Microscopy's OCLC number is recorded as 04072770^[5].
• Scanning Electron Microscopy's Library of Congress authority ID is recorded as n82205857^[6].
• Scanning Electron Microscopy's language of work or name is recorded as English^[7].
• Scanning Electron Microscopy's country of origin is recorded as United States^[8].
• Scanning Electron Microscopy's NLM Unique ID is recorded as 0371617^[9].
• Scanning Electron Microscopy's Scopus source ID is recorded as 33916^[10].
• Scanning Electron Microscopy's replaced by is recorded as Scanning microscopy^[11].
• Scanning Electron Microscopy's title is recorded as Scanning Electron Microscopy^[12].
• Scanning Electron Microscopy's ACNP journal ID is recorded as 19117^[13].
• Scanning Electron Microscopy's ISSN-L is recorded as 0586-5581^[14].
• Scanning Electron Microscopy's National Library of Israel J9U ID is recorded as 987007321366705171^[15].
• Scanning Electron Microscopy's indexed in bibliographic review is recorded as Scopus^[16].
• Scanning Electron Microscopy's HAL journal ID is recorded as 157329^[17].
• Scanning Electron Microscopy's CANTIC ID is recorded as 981058509868306706^[18].
• Scanning Electron Microscopy's OpenAlex ID is recorded as S2754935905^[19].
• Scanning Electron Microscopy's University of Barcelona authority ID is recorded as 981058509868306706^[20].