Scan chain
type of manufacturing test used with integrated circuits
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Scan chain
Summary
Scan chain ranks in the top 2% of general entities by monthly Wikipedia readership (43 views/month).[1]
Key Facts
- Scan chain's subclass of is recorded as test design technique[2].
- Scan chain's has part is recorded as scan cell[3].
- Scan chain's Freebase ID is recorded as /m/09xw26[4].
- Scan chain's Microsoft Academic ID is recorded as 150012182[5].
- Scan chain's OpenAlex ID is recorded as C150012182[6].
Why It Matters
Scan chain ranks in the top 2% of general entities by monthly Wikipedia readership (43 views/month).[1]