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Robust autofocusing for scanning electron microscopy based on a dual deep learning network

Research article (Scientific Reports, 2021) · cited 23× · AI/ML
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Robust autofocusing for scanning electron microscopy based on a dual deep learning network

Summary

Robust autofocusing for scanning electron microscopy based on a dual deep learning network is a scholarly article[1].

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  • Robust autofocusing for scanning electron microscopy based on a dual deep learning network's instance of is recorded as scholarly article[2].

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Direct Wikidata claims

  1. [2] ↑ . wikidata.org.

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  1. [1] ↑ . Wikidata. wikidata.org.

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APA 4ort.xyz Knowledge Graph. (2026). Robust autofocusing for scanning electron microscopy based on a dual deep learning network. Retrieved May 24, 2026, from https://4ort.xyz/entity/robust-autofocusing-for-scanning-electron-microscopy-based-on-a-dual-deep-learning-network
MLA “Robust autofocusing for scanning electron microscopy based on a dual deep learning network.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/robust-autofocusing-for-scanning-electron-microscopy-based-on-a-dual-deep-learning-network.
BibTeX @misc{4ortxyz_robust-autofocusing-for-scanning-electron-microscopy-based-on-a-dual-deep-learning-network_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Robust autofocusing for scanning electron microscopy based on a dual deep learning network}}, year = {2026}, url = {https://4ort.xyz/entity/robust-autofocusing-for-scanning-electron-microscopy-based-on-a-dual-deep-learning-network}, note = {Accessed: 2026-05-24}}
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