Principal Component Analysis in Machine Intelligence-Based Test Generation

Research article (2021 IEEE Microelectronics Design & Test Symposium (MDTS), 2021) · cited 17× · AI/ML
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Principal Component Analysis in Machine Intelligence-Based Test Generation

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Principal Component Analysis in Machine Intelligence-Based Test Generation is a scholarly article[1].

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  • Principal Component Analysis in Machine Intelligence-Based Test Generation's instance of is recorded as scholarly article[2].

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APA 4ort.xyz Knowledge Graph. (2026). Principal Component Analysis in Machine Intelligence-Based Test Generation. Retrieved May 24, 2026, from https://4ort.xyz/entity/principal-component-analysis-in-machine-intelligence-based-test-generation
MLA “Principal Component Analysis in Machine Intelligence-Based Test Generation.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/principal-component-analysis-in-machine-intelligence-based-test-generation.
BibTeX @misc{4ortxyz_principal-component-analysis-in-machine-intelligence-based-test-generation_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Principal Component Analysis in Machine Intelligence-Based Test Generation}}, year = {2026}, url = {https://4ort.xyz/entity/principal-component-analysis-in-machine-intelligence-based-test-generation}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Principal Component Analysis in Machine Intelligence-Based Test Generation — https://4ort.xyz/entity/principal-component-analysis-in-machine-intelligence-based-test-generation (retrieved 2026-05-24)

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