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Post-Silicon Gate-Level Error Localization With Effective and Combined Trace Signal Selection

Research article (IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2018) · cited 15× · AI/ML
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Summary

Post-Silicon Gate-Level Error Localization With Effective and Combined Trace Signal Selection is a scholarly article[1].

Key Facts

  • Post-Silicon Gate-Level Error Localization With Effective and Combined Trace Signal Selection's instance of is recorded as scholarly article[2].

References

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Direct Wikidata claims

  1. [2] ↑ . wikidata.org.

Class ancestry

  1. [1] ↑ . Wikidata. wikidata.org.

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APA 4ort.xyz Knowledge Graph. (2026). Post-Silicon Gate-Level Error Localization With Effective and Combined Trace Signal Selection. Retrieved October 18, 2026, from https://4ort.xyz/entity/post-silicon-gate-level-error-localization-with-effective-and-combined-trace-signal-selection
MLA “Post-Silicon Gate-Level Error Localization With Effective and Combined Trace Signal Selection.” 4ort.xyz Knowledge Graph, 4ort.xyz, 18 Oct. 2026, https://4ort.xyz/entity/post-silicon-gate-level-error-localization-with-effective-and-combined-trace-signal-selection.
BibTeX @misc{4ortxyz_post-silicon-gate-level-error-localization-with-effective-and-combined-trace-signal-selection_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Post-Silicon Gate-Level Error Localization With Effective and Combined Trace Signal Selection}}, year = {2026}, url = {https://4ort.xyz/entity/post-silicon-gate-level-error-localization-with-effective-and-combined-trace-signal-selection}, note = {Accessed: 2026-10-18}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Post-Silicon Gate-Level Error Localization With Effective and Combined Trace Signal Selection — https://4ort.xyz/entity/post-silicon-gate-level-error-localization-with-effective-and-combined-trace-signal-selection (retrieved 2026-10-18)

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