Non-Intrusive Online Distributed Pulse Shrinking-Based Interconnect Testing in 2.5D IC

Research article (IEEE Transactions on Circuits & Systems II Express Briefs, 2019) · cited 51× · AI/ML

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Non-Intrusive Online Distributed Pulse Shrinking-Based Interconnect Testing in 2.5D IC

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Non-Intrusive Online Distributed Pulse Shrinking-Based Interconnect Testing in 2.5D IC is a scholarly article^[1].

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Non-Intrusive Online Distributed Pulse Shrinking-Based Interconnect Testing in 2.5D IC's instance of is recorded as scholarly article^[2].

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Authored by 5

Aibin Yan, Huaguo Liang, Tai Song, Tianming Ni, Zhengfeng Huang

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Aibin Yan, Huaguo Liang, Tai Song, Tianming Ni, Zhengfeng Huang

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[2] ↑ Non-Intrusive Online Distributed Pulse Shrinking-Based Interconnect Testing in 2.5D IC — instance of (P31): scholarly article. wikidata.org.

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[1] ↑ Non-Intrusive Online Distributed Pulse Shrinking-Based Interconnect Testing in 2.5D IC is an instance of scholarly article (scholarly article) [P31, primary]. Wikidata. wikidata.org.

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@misc{4ortxyz_non-intrusive-online-distributed-pulse-shrinking-based-interconnect-testing-in-2-5d-ic_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Non-Intrusive Online Distributed Pulse Shrinking-Based Interconnect Testing in 2.5D IC}}, year = {2026}, url = {https://4ort.xyz/entity/non-intrusive-online-distributed-pulse-shrinking-based-interconnect-testing-in-2-5d-ic}, note = {Accessed: 2026-05-24}}

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