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Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction
Research article (Scientific Reports, 2024) · cited 11× · AI/ML
Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction
Summary
Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction is a scholarly article[1].
Key Facts
Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction's instance of is recorded as scholarly article[2].
References
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APA4ort.xyz Knowledge Graph. (2026). Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction. Retrieved May 24, 2026, from https://4ort.xyz/entity/multiscale-in-situ-characterization-of-static-recrystallization-using-dark-field-x-ray-microscopy-and-high-resolution-x-
MLA“Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/multiscale-in-situ-characterization-of-static-recrystallization-using-dark-field-x-ray-microscopy-and-high-resolution-x-.
BibTeX@misc{4ortxyz_multiscale-in-situ-characterization-of-static-recrystallization-using-dark-field-x-ray-microscopy-and-high-resolution-x-_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction}}, year = {2026}, url = {https://4ort.xyz/entity/multiscale-in-situ-characterization-of-static-recrystallization-using-dark-field-x-ray-microscopy-and-high-resolution-x-}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction — https://4ort.xyz/entity/multiscale-in-situ-characterization-of-static-recrystallization-using-dark-field-x-ray-microscopy-and-high-resolution-x- (retrieved 2026-05-24)
