Multiple beam inspection (MBI) for 7nm node and beyond: technologies and applications

Research article (Metrology, Inspection, and Process Control for Microlithography XXXIII, 2019) · cited 10× · AI/ML
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Multiple beam inspection (MBI) for 7nm node and beyond: technologies and applications

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Multiple beam inspection (MBI) for 7nm node and beyond: technologies and applications is a scholarly article[1].

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  • Multiple beam inspection (MBI) for 7nm node and beyond: technologies and applications's instance of is recorded as scholarly article[2].

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APA 4ort.xyz Knowledge Graph. (2026). Multiple beam inspection (MBI) for 7nm node and beyond: technologies and applications. Retrieved May 24, 2026, from https://4ort.xyz/entity/multiple-beam-inspection-mbi-for-7nm-node-and-beyond-technologies-and-applications
MLA “Multiple beam inspection (MBI) for 7nm node and beyond: technologies and applications.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/multiple-beam-inspection-mbi-for-7nm-node-and-beyond-technologies-and-applications.
BibTeX @misc{4ortxyz_multiple-beam-inspection-mbi-for-7nm-node-and-beyond-technologies-and-applications_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Multiple beam inspection (MBI) for 7nm node and beyond: technologies and applications}}, year = {2026}, url = {https://4ort.xyz/entity/multiple-beam-inspection-mbi-for-7nm-node-and-beyond-technologies-and-applications}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Multiple beam inspection (MBI) for 7nm node and beyond: technologies and applications — https://4ort.xyz/entity/multiple-beam-inspection-mbi-for-7nm-node-and-beyond-technologies-and-applications (retrieved 2026-05-24)

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