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MaMiNet: Memory-attended multi-inference network for surface-defect detection

Research article (Computers in Industry, 2022) · cited 24× · AI/ML
academia openalex:W4311009280
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MaMiNet: Memory-attended multi-inference network for surface-defect detection

Summary

MaMiNet: Memory-attended multi-inference network for surface-defect detection is a scholarly article[1].

Key Facts

  • MaMiNet: Memory-attended multi-inference network for surface-defect detection's instance of is recorded as scholarly article[2].

References

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Direct Wikidata claims

  1. [2] ↑ . wikidata.org.

Class ancestry

  1. [1] ↑ . Wikidata. wikidata.org.

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Use these citations when quoting this entity in research, articles, AI prompts, or wherever provenance matters. We aggregate Wikidata + Wikipedia + authoritative open-data sources; the stitched, scored, cross-referenced view is what 4ort.xyz contributes.

APA 4ort.xyz Knowledge Graph. (2026). MaMiNet: Memory-attended multi-inference network for surface-defect detection. Retrieved May 24, 2026, from https://4ort.xyz/entity/maminet-memory-attended-multi-inference-network-for-surface-defect-detection
MLA “MaMiNet: Memory-attended multi-inference network for surface-defect detection.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/maminet-memory-attended-multi-inference-network-for-surface-defect-detection.
BibTeX @misc{4ortxyz_maminet-memory-attended-multi-inference-network-for-surface-defect-detection_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{MaMiNet: Memory-attended multi-inference network for surface-defect detection}}, year = {2026}, url = {https://4ort.xyz/entity/maminet-memory-attended-multi-inference-network-for-surface-defect-detection}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): MaMiNet: Memory-attended multi-inference network for surface-defect detection — https://4ort.xyz/entity/maminet-memory-attended-multi-inference-network-for-surface-defect-detection (retrieved 2026-05-24)

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