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Machine learning based test pattern analysis for localizing critical power activity areas

Research article (2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2017) · cited 10× · AI/ML
academia openalex:W2782929815
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Machine learning based test pattern analysis for localizing critical power activity areas

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Machine learning based test pattern analysis for localizing critical power activity areas is a scholarly article[1].

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  • Machine learning based test pattern analysis for localizing critical power activity areas's instance of is recorded as scholarly article[2].

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Rolf Drechsler

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  1. [2] ↑ . wikidata.org.

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  1. [1] ↑ . Wikidata. wikidata.org.

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APA 4ort.xyz Knowledge Graph. (2026). Machine learning based test pattern analysis for localizing critical power activity areas. Retrieved May 24, 2026, from https://4ort.xyz/entity/machine-learning-based-test-pattern-analysis-for-localizing-critical-power-activity-areas
MLA “Machine learning based test pattern analysis for localizing critical power activity areas.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/machine-learning-based-test-pattern-analysis-for-localizing-critical-power-activity-areas.
BibTeX @misc{4ortxyz_machine-learning-based-test-pattern-analysis-for-localizing-critical-power-activity-areas_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Machine learning based test pattern analysis for localizing critical power activity areas}}, year = {2026}, url = {https://4ort.xyz/entity/machine-learning-based-test-pattern-analysis-for-localizing-critical-power-activity-areas}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Machine learning based test pattern analysis for localizing critical power activity areas — https://4ort.xyz/entity/machine-learning-based-test-pattern-analysis-for-localizing-critical-power-activity-areas (retrieved 2026-05-24)

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