Machine Learning-Based Statistical Approach to Analyze Process Dependencies on Threshold Voltage in Recessed Gate AlGaN/GaN MIS-HEMTs

Research article (IEEE Transactions on Electron Devices, 2020) · cited 38× · AI/ML
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Machine Learning-Based Statistical Approach to Analyze Process Dependencies on Threshold Voltage in Recessed Gate AlGaN/GaN MIS-HEMTs

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Machine Learning-Based Statistical Approach to Analyze Process Dependencies on Threshold Voltage in Recessed Gate AlGaN/GaN MIS-HEMTs is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Machine Learning-Based Statistical Approach to Analyze Process Dependencies on Threshold Voltage in Recessed Gate AlGaN/GaN MIS-HEMTs. Retrieved May 24, 2026, from https://4ort.xyz/entity/machine-learning-based-statistical-approach-to-analyze-process-dependencies-on-threshold-voltage-in-recessed-gate-algan-
MLA “Machine Learning-Based Statistical Approach to Analyze Process Dependencies on Threshold Voltage in Recessed Gate AlGaN/GaN MIS-HEMTs.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/machine-learning-based-statistical-approach-to-analyze-process-dependencies-on-threshold-voltage-in-recessed-gate-algan-.
BibTeX @misc{4ortxyz_machine-learning-based-statistical-approach-to-analyze-process-dependencies-on-threshold-voltage-in-recessed-gate-algan-_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Machine Learning-Based Statistical Approach to Analyze Process Dependencies on Threshold Voltage in Recessed Gate AlGaN/GaN MIS-HEMTs}}, year = {2026}, url = {https://4ort.xyz/entity/machine-learning-based-statistical-approach-to-analyze-process-dependencies-on-threshold-voltage-in-recessed-gate-algan-}, note = {Accessed: 2026-05-24}}
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