Machine Learning-Assisted Statistical Variation Analysis of Ferroelectric Transistor: From Experimental Metrology to Adaptive Modeling

Research article (IEEE Transactions on Electron Devices, 2023) · cited 16× · AI/ML
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Machine Learning-Assisted Statistical Variation Analysis of Ferroelectric Transistor: From Experimental Metrology to Adaptive Modeling

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BibTeX @misc{4ortxyz_machine-learning-assisted-statistical-variation-analysis-of-ferroelectric-transistor-from-experimental-metrology-to-adap_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Machine Learning-Assisted Statistical Variation Analysis of Ferroelectric Transistor: From Experimental Metrology to Adaptive Modeling}}, year = {2026}, url = {https://4ort.xyz/entity/machine-learning-assisted-statistical-variation-analysis-of-ferroelectric-transistor-from-experimental-metrology-to-adap}, note = {Accessed: 2026-05-24}}
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