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Linear regression combined KNN algorithm to identify latent defects for imbalance data of ICs

Research article (Microelectronics Journal, 2022) · cited 32× · AI/ML
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Linear regression combined KNN algorithm to identify latent defects for imbalance data of ICs

Summary

Linear regression combined KNN algorithm to identify latent defects for imbalance data of ICs is a scholarly article[1].

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  • Linear regression combined KNN algorithm to identify latent defects for imbalance data of ICs's instance of is recorded as scholarly article[2].

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Direct Wikidata claims

  1. [2] ↑ . wikidata.org.

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  1. [1] ↑ . Wikidata. wikidata.org.

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APA 4ort.xyz Knowledge Graph. (2026). Linear regression combined KNN algorithm to identify latent defects for imbalance data of ICs. Retrieved May 24, 2026, from https://4ort.xyz/entity/linear-regression-combined-knn-algorithm-to-identify-latent-defects-for-imbalance-data-of-ics
MLA “Linear regression combined KNN algorithm to identify latent defects for imbalance data of ICs.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/linear-regression-combined-knn-algorithm-to-identify-latent-defects-for-imbalance-data-of-ics.
BibTeX @misc{4ortxyz_linear-regression-combined-knn-algorithm-to-identify-latent-defects-for-imbalance-data-of-ics_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Linear regression combined KNN algorithm to identify latent defects for imbalance data of ICs}}, year = {2026}, url = {https://4ort.xyz/entity/linear-regression-combined-knn-algorithm-to-identify-latent-defects-for-imbalance-data-of-ics}, note = {Accessed: 2026-05-24}}
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