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Innovative methodological approach integrating SEM-EDS and TXRF microanalysis for characterization in materials science: A perspective from cultural heritage studies
Research article (Spectrochimica Acta Part B Atomic Spectroscopy, 2024) · cited 14× · AI/ML
Innovative methodological approach integrating SEM-EDS and TXRF microanalysis for characterization in materials science: A perspective from cultural heritage studies
Summary
Innovative methodological approach integrating SEM-EDS and TXRF microanalysis for characterization in materials science: A perspective from cultural heritage studies is a scholarly article[1].
Key Facts
Innovative methodological approach integrating SEM-EDS and TXRF microanalysis for characterization in materials science: A perspective from cultural heritage studies's instance of is recorded as scholarly article[2].
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APA4ort.xyz Knowledge Graph. (2026). Innovative methodological approach integrating SEM-EDS and TXRF microanalysis for characterization in materials science: A perspective from cultural heritage studies. Retrieved May 24, 2026, from https://4ort.xyz/entity/innovative-methodological-approach-integrating-sem-eds-and-txrf-microanalysis-for-characterization-in-materials-science-
MLA“Innovative methodological approach integrating SEM-EDS and TXRF microanalysis for characterization in materials science: A perspective from cultural heritage studies.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/innovative-methodological-approach-integrating-sem-eds-and-txrf-microanalysis-for-characterization-in-materials-science-.
BibTeX@misc{4ortxyz_innovative-methodological-approach-integrating-sem-eds-and-txrf-microanalysis-for-characterization-in-materials-science-_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Innovative methodological approach integrating SEM-EDS and TXRF microanalysis for characterization in materials science: A perspective from cultural heritage studies}}, year = {2026}, url = {https://4ort.xyz/entity/innovative-methodological-approach-integrating-sem-eds-and-txrf-microanalysis-for-characterization-in-materials-science-}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Innovative methodological approach integrating SEM-EDS and TXRF microanalysis for characterization in materials science: A perspective from cultural heritage studies — https://4ort.xyz/entity/innovative-methodological-approach-integrating-sem-eds-and-txrf-microanalysis-for-characterization-in-materials-science- (retrieved 2026-05-24)
