Improvement of TCAD Augmented Machine Learning Using Autoencoder for Semiconductor Variation Identification and Inverse Design

Research article (IEEE Access, 2020) · cited 68× · AI/ML
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Improvement of TCAD Augmented Machine Learning Using Autoencoder for Semiconductor Variation Identification and Inverse Design

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Improvement of TCAD Augmented Machine Learning Using Autoencoder for Semiconductor Variation Identification and Inverse Design is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Improvement of TCAD Augmented Machine Learning Using Autoencoder for Semiconductor Variation Identification and Inverse Design. Retrieved May 24, 2026, from https://4ort.xyz/entity/improvement-of-tcad-augmented-machine-learning-using-autoencoder-for-semiconductor-variation-identification-and-inverse-
MLA “Improvement of TCAD Augmented Machine Learning Using Autoencoder for Semiconductor Variation Identification and Inverse Design.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/improvement-of-tcad-augmented-machine-learning-using-autoencoder-for-semiconductor-variation-identification-and-inverse-.
BibTeX @misc{4ortxyz_improvement-of-tcad-augmented-machine-learning-using-autoencoder-for-semiconductor-variation-identification-and-inverse-_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Improvement of TCAD Augmented Machine Learning Using Autoencoder for Semiconductor Variation Identification and Inverse Design}}, year = {2026}, url = {https://4ort.xyz/entity/improvement-of-tcad-augmented-machine-learning-using-autoencoder-for-semiconductor-variation-identification-and-inverse-}, note = {Accessed: 2026-05-24}}
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