Improved U-Net with Residual Attention Block for Mixed-Defect Wafer Maps

Research article (Applied Sciences, 2022) · cited 31× · AI/ML
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Improved U-Net with Residual Attention Block for Mixed-Defect Wafer Maps

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Improved U-Net with Residual Attention Block for Mixed-Defect Wafer Maps is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Improved U-Net with Residual Attention Block for Mixed-Defect Wafer Maps. Retrieved May 24, 2026, from https://4ort.xyz/entity/improved-u-net-with-residual-attention-block-for-mixed-defect-wafer-maps
MLA “Improved U-Net with Residual Attention Block for Mixed-Defect Wafer Maps.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/improved-u-net-with-residual-attention-block-for-mixed-defect-wafer-maps.
BibTeX @misc{4ortxyz_improved-u-net-with-residual-attention-block-for-mixed-defect-wafer-maps_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Improved U-Net with Residual Attention Block for Mixed-Defect Wafer Maps}}, year = {2026}, url = {https://4ort.xyz/entity/improved-u-net-with-residual-attention-block-for-mixed-defect-wafer-maps}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Improved U-Net with Residual Attention Block for Mixed-Defect Wafer Maps — https://4ort.xyz/entity/improved-u-net-with-residual-attention-block-for-mixed-defect-wafer-maps (retrieved 2026-05-24)

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