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IEEE Transactions on Device and Materials Reliability

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IEEE Transactions on Device and Materials Reliability

Summary

IEEE Transactions on Device and Materials Reliability is a periodical[1].

Key Facts

  • IEEE Transactions on Device and Materials Reliability's instance of is recorded as periodical[2].
  • IEEE Transactions on Device and Materials Reliability's publisher is recorded as Institute of Electrical and Electronics Engineers[3].
  • IEEE Transactions on Device and Materials Reliability's ISSN is recorded as 1530-4388[4].
  • IEEE Transactions on Device and Materials Reliability's ISSN is recorded as 1558-2574[5].
  • IEEE Transactions on Device and Materials Reliability's language of work or name is recorded as English[6].
  • IEEE Transactions on Device and Materials Reliability's archives at is recorded as Portico[7].
  • IEEE Transactions on Device and Materials Reliability's country of origin is recorded as United States[8].
  • IEEE Transactions on Device and Materials Reliability's official website is recorded as http://ieeexplore.ieee.org/servlet/opac?punumber=7298[9].
  • IEEE Transactions on Device and Materials Reliability's NLM Unique ID is recorded as 101210713[10].
  • IEEE Transactions on Device and Materials Reliability's ERA Journal ID is recorded as 44851[11].
  • IEEE Transactions on Device and Materials Reliability's Scopus source ID is recorded as 26049[12].
  • IEEE Transactions on Device and Materials Reliability's Danish Bibliometric Research Indicator level is recorded as 1[13].
  • IEEE Transactions on Device and Materials Reliability's Danish Bibliometric Research Indicator is recorded as 12923[14].
  • IEEE Transactions on Device and Materials Reliability's JUFO ID is recorded as 57534[15].
  • IEEE Transactions on Device and Materials Reliability's title is recorded as IEEE Transactions on Device and Materials Reliability[16].
  • IEEE Transactions on Device and Materials Reliability's Google Knowledge Graph ID is recorded as /g/11r80nqm1[17].
  • IEEE Transactions on Device and Materials Reliability's OpenCitations bibliographic resource ID is recorded as 906627[18].
  • IEEE Transactions on Device and Materials Reliability's ACNP journal ID is recorded as 2105428[19].
  • IEEE Transactions on Device and Materials Reliability's ACNP journal ID is recorded as 2108376[20].
  • IEEE Transactions on Device and Materials Reliability's ISSN-L is recorded as 1530-4388[21].
  • IEEE Transactions on Device and Materials Reliability's Scilit journal ID is recorded as 208291[22].
  • IEEE Transactions on Device and Materials Reliability's Crossref journal ID is recorded as 5451[23].
  • IEEE Transactions on Device and Materials Reliability's indexed in bibliographic review is recorded as Scopus[24].
  • IEEE Transactions on Device and Materials Reliability's HAL journal ID is recorded as 14049[25].
  • IEEE Transactions on Device and Materials Reliability's OpenAlex ID is recorded as S128536549[26].

Body

Designation and Status

IEEE Transactions on Device and Materials Reliability's instance of is recorded as periodical[2].

References

Programmatic citations — every numbered marker resolves to a verifiable graph row below.

Direct Wikidata claims

  1. [2] ↑ . wikidata.org.
  2. [3] ↑ . wikidata.org.
  3. [4] ↑ . wikidata.org.
  4. [5] ↑ . api.crossref.org. Retrieved . api.crossref.org. Provenance: wikidata.org.
  5. [6] ↑ . ISSN Portal. wikidata.org.
  6. [7] ↑ . wikidata.org.
  7. [8] ↑ . ISSN Portal. wikidata.org.
  8. [9] ↑ . ISSN Portal. wikidata.org.
  9. [10] ↑ . wikidata.org.
  10. [11] ↑ . ERA 2010 journal list. wikidata.org.
  11. [12] ↑ . Scopus. wikidata.org.
  12. [13] ↑ . BFI 2012 journal list. wikidata.org.
  13. [14] ↑ . BFI 2012 journal list. wikidata.org.
  14. [15] ↑ . wikidata.org.
  15. [16] ↑ . ISSN Portal. wikidata.org.
  16. [17] ↑ . wikidata.org.
  17. [18] ↑ . OpenCitations Corpus. wikidata.org.
  18. [19] ↑ . National Collective Archive of Periodicals. Retrieved . wikidata.org.
  19. [20] ↑ . National Collective Archive of Periodicals. Retrieved . wikidata.org.
  20. [21] ↑ . wikidata.org.
  21. [22] ↑ . wikidata.org.
  22. [23] ↑ . wikidata.org.
  23. [24] ↑ . wikidata.org.
  24. [25] ↑ . wikidata.org.
  25. [26] ↑ . OpenAlex. wikidata.org.

Class ancestry

  1. [1] ↑ . Wikidata. wikidata.org.

📑 Cite this page

Use these citations when quoting this entity in research, articles, AI prompts, or wherever provenance matters. We aggregate Wikidata + Wikipedia + authoritative open-data sources; the stitched, scored, cross-referenced view is what 4ort.xyz contributes.

APA 4ort.xyz Knowledge Graph. (2026). IEEE Transactions on Device and Materials Reliability. Retrieved May 3, 2026, from https://4ort.xyz/entity/ieee-transactions-on-device-and-materials-reliability
MLA “IEEE Transactions on Device and Materials Reliability.” 4ort.xyz Knowledge Graph, 4ort.xyz, 3 May. 2026, https://4ort.xyz/entity/ieee-transactions-on-device-and-materials-reliability.
BibTeX @misc{4ortxyz_ieee-transactions-on-device-and-materials-reliability_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{IEEE Transactions on Device and Materials Reliability}}, year = {2026}, url = {https://4ort.xyz/entity/ieee-transactions-on-device-and-materials-reliability}, note = {Accessed: 2026-05-03}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): IEEE Transactions on Device and Materials Reliability — https://4ort.xyz/entity/ieee-transactions-on-device-and-materials-reliability (retrieved 2026-05-03)

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