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High Resolution Surface Metrology Using Microsphere‐Assisted Interference Microscopy

Research article (physica status solidi (a), 2019) · cited 15× · AI/ML
academia openalex:W2917142629
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High Resolution Surface Metrology Using Microsphere‐Assisted Interference Microscopy

Summary

High Resolution Surface Metrology Using Microsphere‐Assisted Interference Microscopy is a scholarly article[1].

Key Facts

  • High Resolution Surface Metrology Using Microsphere‐Assisted Interference Microscopy's instance of is recorded as scholarly article[2].

References

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Direct Wikidata claims

  1. [2] ↑ . wikidata.org.

Class ancestry

  1. [1] ↑ . Wikidata. wikidata.org.

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Use these citations when quoting this entity in research, articles, AI prompts, or wherever provenance matters. We aggregate Wikidata + Wikipedia + authoritative open-data sources; the stitched, scored, cross-referenced view is what 4ort.xyz contributes.

APA 4ort.xyz Knowledge Graph. (2026). High Resolution Surface Metrology Using Microsphere‐Assisted Interference Microscopy. Retrieved May 24, 2026, from https://4ort.xyz/entity/high-resolution-surface-metrology-using-microsphereassisted-interference-microscopy
MLA “High Resolution Surface Metrology Using Microsphere‐Assisted Interference Microscopy.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/high-resolution-surface-metrology-using-microsphereassisted-interference-microscopy.
BibTeX @misc{4ortxyz_high-resolution-surface-metrology-using-microsphereassisted-interference-microscopy_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{High Resolution Surface Metrology Using Microsphere‐Assisted Interference Microscopy}}, year = {2026}, url = {https://4ort.xyz/entity/high-resolution-surface-metrology-using-microsphereassisted-interference-microscopy}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): High Resolution Surface Metrology Using Microsphere‐Assisted Interference Microscopy — https://4ort.xyz/entity/high-resolution-surface-metrology-using-microsphereassisted-interference-microscopy (retrieved 2026-05-24)

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