Facile and Reliable Thickness Identification of Atomically Thin Dichalcogenide Semiconductors Using Hyperspectral Microscopy

Research article (Nanomaterials, 2020) · cited 10× · AI/ML
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Facile and Reliable Thickness Identification of Atomically Thin Dichalcogenide Semiconductors Using Hyperspectral Microscopy

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Facile and Reliable Thickness Identification of Atomically Thin Dichalcogenide Semiconductors Using Hyperspectral Microscopy is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Facile and Reliable Thickness Identification of Atomically Thin Dichalcogenide Semiconductors Using Hyperspectral Microscopy. Retrieved May 24, 2026, from https://4ort.xyz/entity/facile-and-reliable-thickness-identification-of-atomically-thin-dichalcogenide-semiconductors-using-hyperspectral-micros
MLA “Facile and Reliable Thickness Identification of Atomically Thin Dichalcogenide Semiconductors Using Hyperspectral Microscopy.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/facile-and-reliable-thickness-identification-of-atomically-thin-dichalcogenide-semiconductors-using-hyperspectral-micros.
BibTeX @misc{4ortxyz_facile-and-reliable-thickness-identification-of-atomically-thin-dichalcogenide-semiconductors-using-hyperspectral-micros_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Facile and Reliable Thickness Identification of Atomically Thin Dichalcogenide Semiconductors Using Hyperspectral Microscopy}}, year = {2026}, url = {https://4ort.xyz/entity/facile-and-reliable-thickness-identification-of-atomically-thin-dichalcogenide-semiconductors-using-hyperspectral-micros}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Facile and Reliable Thickness Identification of Atomically Thin Dichalcogenide Semiconductors Using Hyperspectral Microscopy — https://4ort.xyz/entity/facile-and-reliable-thickness-identification-of-atomically-thin-dichalcogenide-semiconductors-using-hyperspectral-micros (retrieved 2026-05-24)

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