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EMFORCED: EM-Based Fingerprinting Framework for Remarked and Cloned Counterfeit IC Detection Using Machine Learning Classification
Research article (IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2019) · cited 34× · AI/ML
EMFORCED: EM-Based Fingerprinting Framework for Remarked and Cloned Counterfeit IC Detection Using Machine Learning Classification
Summary
EMFORCED: EM-Based Fingerprinting Framework for Remarked and Cloned Counterfeit IC Detection Using Machine Learning Classification is a scholarly article[1].
Key Facts
EMFORCED: EM-Based Fingerprinting Framework for Remarked and Cloned Counterfeit IC Detection Using Machine Learning Classification's instance of is recorded as scholarly article[2].
References
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APA4ort.xyz Knowledge Graph. (2026). EMFORCED: EM-Based Fingerprinting Framework for Remarked and Cloned Counterfeit IC Detection Using Machine Learning Classification. Retrieved May 24, 2026, from https://4ort.xyz/entity/emforced-em-based-fingerprinting-framework-for-remarked-and-cloned-counterfeit-ic-detection-using-machine-learning-class
MLA“EMFORCED: EM-Based Fingerprinting Framework for Remarked and Cloned Counterfeit IC Detection Using Machine Learning Classification.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/emforced-em-based-fingerprinting-framework-for-remarked-and-cloned-counterfeit-ic-detection-using-machine-learning-class.
BibTeX@misc{4ortxyz_emforced-em-based-fingerprinting-framework-for-remarked-and-cloned-counterfeit-ic-detection-using-machine-learning-class_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{EMFORCED: EM-Based Fingerprinting Framework for Remarked and Cloned Counterfeit IC Detection Using Machine Learning Classification}}, year = {2026}, url = {https://4ort.xyz/entity/emforced-em-based-fingerprinting-framework-for-remarked-and-cloned-counterfeit-ic-detection-using-machine-learning-class}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): EMFORCED: EM-Based Fingerprinting Framework for Remarked and Cloned Counterfeit IC Detection Using Machine Learning Classification — https://4ort.xyz/entity/emforced-em-based-fingerprinting-framework-for-remarked-and-cloned-counterfeit-ic-detection-using-machine-learning-class (retrieved 2026-05-24)
