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Efficient Mixed-Type Wafer Defect Pattern Recognition Based on Light-Weight Neural Network

Research article (Micromachines, 2024) · cited 14× · AI/ML
academia openalex:W4400130022
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Efficient Mixed-Type Wafer Defect Pattern Recognition Based on Light-Weight Neural Network

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Efficient Mixed-Type Wafer Defect Pattern Recognition Based on Light-Weight Neural Network is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Efficient Mixed-Type Wafer Defect Pattern Recognition Based on Light-Weight Neural Network. Retrieved May 24, 2026, from https://4ort.xyz/entity/efficient-mixed-type-wafer-defect-pattern-recognition-based-on-light-weight-neural-network
MLA “Efficient Mixed-Type Wafer Defect Pattern Recognition Based on Light-Weight Neural Network.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/efficient-mixed-type-wafer-defect-pattern-recognition-based-on-light-weight-neural-network.
BibTeX @misc{4ortxyz_efficient-mixed-type-wafer-defect-pattern-recognition-based-on-light-weight-neural-network_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Efficient Mixed-Type Wafer Defect Pattern Recognition Based on Light-Weight Neural Network}}, year = {2026}, url = {https://4ort.xyz/entity/efficient-mixed-type-wafer-defect-pattern-recognition-based-on-light-weight-neural-network}, note = {Accessed: 2026-05-24}}
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