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Deformable Convolutional Networks for Efficient Mixed-Type Wafer Defect Pattern Recognition

Research article (IEEE Transactions on Semiconductor Manufacturing, 2020) · cited 199× · AI/ML
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Deformable Convolutional Networks for Efficient Mixed-Type Wafer Defect Pattern Recognition

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Deformable Convolutional Networks for Efficient Mixed-Type Wafer Defect Pattern Recognition is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Deformable Convolutional Networks for Efficient Mixed-Type Wafer Defect Pattern Recognition. Retrieved May 24, 2026, from https://4ort.xyz/entity/deformable-convolutional-networks-for-efficient-mixed-type-wafer-defect-pattern-recognition
MLA “Deformable Convolutional Networks for Efficient Mixed-Type Wafer Defect Pattern Recognition.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/deformable-convolutional-networks-for-efficient-mixed-type-wafer-defect-pattern-recognition.
BibTeX @misc{4ortxyz_deformable-convolutional-networks-for-efficient-mixed-type-wafer-defect-pattern-recognition_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Deformable Convolutional Networks for Efficient Mixed-Type Wafer Defect Pattern Recognition}}, year = {2026}, url = {https://4ort.xyz/entity/deformable-convolutional-networks-for-efficient-mixed-type-wafer-defect-pattern-recognition}, note = {Accessed: 2026-05-24}}
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