Defect localisation and quantitative identification in multi-layer conductive structures based on projection pursuit algorithm

Research article (Nondestructive Testing And Evaluation, 2018) · cited 16× · AI/ML
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Defect localisation and quantitative identification in multi-layer conductive structures based on projection pursuit algorithm

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Defect localisation and quantitative identification in multi-layer conductive structures based on projection pursuit algorithm is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Defect localisation and quantitative identification in multi-layer conductive structures based on projection pursuit algorithm. Retrieved May 24, 2026, from https://4ort.xyz/entity/defect-localisation-and-quantitative-identification-in-multi-layer-conductive-structures-based-on-projection-pursuit-alg
MLA “Defect localisation and quantitative identification in multi-layer conductive structures based on projection pursuit algorithm.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/defect-localisation-and-quantitative-identification-in-multi-layer-conductive-structures-based-on-projection-pursuit-alg.
BibTeX @misc{4ortxyz_defect-localisation-and-quantitative-identification-in-multi-layer-conductive-structures-based-on-projection-pursuit-alg_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Defect localisation and quantitative identification in multi-layer conductive structures based on projection pursuit algorithm}}, year = {2026}, url = {https://4ort.xyz/entity/defect-localisation-and-quantitative-identification-in-multi-layer-conductive-structures-based-on-projection-pursuit-alg}, note = {Accessed: 2026-05-24}}
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