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Defect detection using windowed Fourier spectrum analysis in diffraction phase microscopy

Research article (Journal of Physics Communications, 2019) · cited 21× · AI/ML
academia openalex:W2911699145
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Defect detection using windowed Fourier spectrum analysis in diffraction phase microscopy

Summary

Defect detection using windowed Fourier spectrum analysis in diffraction phase microscopy is a scholarly article[1].

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  • Defect detection using windowed Fourier spectrum analysis in diffraction phase microscopy's instance of is recorded as scholarly article[2].

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Direct Wikidata claims

  1. [2] ↑ . wikidata.org.

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  1. [1] ↑ . Wikidata. wikidata.org.

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APA 4ort.xyz Knowledge Graph. (2026). Defect detection using windowed Fourier spectrum analysis in diffraction phase microscopy. Retrieved May 24, 2026, from https://4ort.xyz/entity/defect-detection-using-windowed-fourier-spectrum-analysis-in-diffraction-phase-microscopy
MLA “Defect detection using windowed Fourier spectrum analysis in diffraction phase microscopy.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/defect-detection-using-windowed-fourier-spectrum-analysis-in-diffraction-phase-microscopy.
BibTeX @misc{4ortxyz_defect-detection-using-windowed-fourier-spectrum-analysis-in-diffraction-phase-microscopy_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Defect detection using windowed Fourier spectrum analysis in diffraction phase microscopy}}, year = {2026}, url = {https://4ort.xyz/entity/defect-detection-using-windowed-fourier-spectrum-analysis-in-diffraction-phase-microscopy}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Defect detection using windowed Fourier spectrum analysis in diffraction phase microscopy — https://4ort.xyz/entity/defect-detection-using-windowed-fourier-spectrum-analysis-in-diffraction-phase-microscopy (retrieved 2026-05-24)

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