Defect clustering-aware spare-TSV allocation for 3D ICs

Research article (2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 2015) · cited 10× · AI/ML
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Defect clustering-aware spare-TSV allocation for 3D ICs

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Defect clustering-aware spare-TSV allocation for 3D ICs is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Defect clustering-aware spare-TSV allocation for 3D ICs. Retrieved May 24, 2026, from https://4ort.xyz/entity/defect-clustering-aware-spare-tsv-allocation-for-3d-ics
MLA “Defect clustering-aware spare-TSV allocation for 3D ICs.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/defect-clustering-aware-spare-tsv-allocation-for-3d-ics.
BibTeX @misc{4ortxyz_defect-clustering-aware-spare-tsv-allocation-for-3d-ics_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Defect clustering-aware spare-TSV allocation for 3D ICs}}, year = {2026}, url = {https://4ort.xyz/entity/defect-clustering-aware-spare-tsv-allocation-for-3d-ics}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Defect clustering-aware spare-TSV allocation for 3D ICs — https://4ort.xyz/entity/defect-clustering-aware-spare-tsv-allocation-for-3d-ics (retrieved 2026-05-24)

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