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Chip defect detection based on deep learning method

Research article (2021 IEEE International Conference on Power Electronics, Computer Applications (ICPECA), 2021) · cited 15× · AI/ML
academia openalex:W3135837842
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Chip defect detection based on deep learning method

Summary

Chip defect detection based on deep learning method is a scholarly article[1].

Key Facts

  • Chip defect detection based on deep learning method's instance of is recorded as scholarly article[2].

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Direct Wikidata claims

  1. [2] ↑ . wikidata.org.

Class ancestry

  1. [1] ↑ . Wikidata. wikidata.org.

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APA 4ort.xyz Knowledge Graph. (2026). Chip defect detection based on deep learning method. Retrieved May 24, 2026, from https://4ort.xyz/entity/chip-defect-detection-based-on-deep-learning-method
MLA “Chip defect detection based on deep learning method.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/chip-defect-detection-based-on-deep-learning-method.
BibTeX @misc{4ortxyz_chip-defect-detection-based-on-deep-learning-method_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Chip defect detection based on deep learning method}}, year = {2026}, url = {https://4ort.xyz/entity/chip-defect-detection-based-on-deep-learning-method}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Chip defect detection based on deep learning method — https://4ort.xyz/entity/chip-defect-detection-based-on-deep-learning-method (retrieved 2026-05-24)

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