Atomic force microscopy combined with optical tweezers (AFM/OT)

Research article (Measurement Science and Technology, 2016) · cited 24× · AI/ML
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Atomic force microscopy combined with optical tweezers (AFM/OT)

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Atomic force microscopy combined with optical tweezers (AFM/OT) is a scholarly article[1].

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  • Atomic force microscopy combined with optical tweezers (AFM/OT)'s instance of is recorded as scholarly article[2].

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APA 4ort.xyz Knowledge Graph. (2026). Atomic force microscopy combined with optical tweezers (AFM/OT). Retrieved May 24, 2026, from https://4ort.xyz/entity/atomic-force-microscopy-combined-with-optical-tweezers-afm-ot
MLA “Atomic force microscopy combined with optical tweezers (AFM/OT).” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/atomic-force-microscopy-combined-with-optical-tweezers-afm-ot.
BibTeX @misc{4ortxyz_atomic-force-microscopy-combined-with-optical-tweezers-afm-ot_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Atomic force microscopy combined with optical tweezers (AFM/OT)}}, year = {2026}, url = {https://4ort.xyz/entity/atomic-force-microscopy-combined-with-optical-tweezers-afm-ot}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Atomic force microscopy combined with optical tweezers (AFM/OT) — https://4ort.xyz/entity/atomic-force-microscopy-combined-with-optical-tweezers-afm-ot (retrieved 2026-05-24)

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