Applications of Scanning Electron Microscopy Using Secondary and Backscattered Electron Signals in Neural Structure

Research article (Frontiers in Neuroanatomy, 2021) · cited 38× · AI/ML
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Applications of Scanning Electron Microscopy Using Secondary and Backscattered Electron Signals in Neural Structure

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Applications of Scanning Electron Microscopy Using Secondary and Backscattered Electron Signals in Neural Structure is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Applications of Scanning Electron Microscopy Using Secondary and Backscattered Electron Signals in Neural Structure. Retrieved May 24, 2026, from https://4ort.xyz/entity/applications-of-scanning-electron-microscopy-using-secondary-and-backscattered-electron-signals-in-neural-structure
MLA “Applications of Scanning Electron Microscopy Using Secondary and Backscattered Electron Signals in Neural Structure.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/applications-of-scanning-electron-microscopy-using-secondary-and-backscattered-electron-signals-in-neural-structure.
BibTeX @misc{4ortxyz_applications-of-scanning-electron-microscopy-using-secondary-and-backscattered-electron-signals-in-neural-structure_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Applications of Scanning Electron Microscopy Using Secondary and Backscattered Electron Signals in Neural Structure}}, year = {2026}, url = {https://4ort.xyz/entity/applications-of-scanning-electron-microscopy-using-secondary-and-backscattered-electron-signals-in-neural-structure}, note = {Accessed: 2026-05-24}}
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