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Algorithm based adaptive parametric testing for outlier detection and test time reduction

Research article (2018 IEEE International Conference on Microelectronic Test Structures (ICMTS), 2018) · cited 10× · AI/ML
academia openalex:W2808222545
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Algorithm based adaptive parametric testing for outlier detection and test time reduction

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Algorithm based adaptive parametric testing for outlier detection and test time reduction is a scholarly article[1].

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  • Algorithm based adaptive parametric testing for outlier detection and test time reduction's instance of is recorded as scholarly article[2].

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  1. [1] ↑ . Wikidata. wikidata.org.

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APA 4ort.xyz Knowledge Graph. (2026). Algorithm based adaptive parametric testing for outlier detection and test time reduction. Retrieved May 24, 2026, from https://4ort.xyz/entity/algorithm-based-adaptive-parametric-testing-for-outlier-detection-and-test-time-reduction
MLA “Algorithm based adaptive parametric testing for outlier detection and test time reduction.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/algorithm-based-adaptive-parametric-testing-for-outlier-detection-and-test-time-reduction.
BibTeX @misc{4ortxyz_algorithm-based-adaptive-parametric-testing-for-outlier-detection-and-test-time-reduction_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Algorithm based adaptive parametric testing for outlier detection and test time reduction}}, year = {2026}, url = {https://4ort.xyz/entity/algorithm-based-adaptive-parametric-testing-for-outlier-detection-and-test-time-reduction}, note = {Accessed: 2026-05-24}}
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