Albert V. Davydov
Researcher / author (OpenAlex)
Facts
2 properties- Affiliation
- National Institute of Standards and Technology, National Institute for Materials Scienceas of 2026-09-23
where from?
- Source
- OpenAlex
- Edition
- 20260923 · as of 2026-09-23
- Licence
- CC0 1.0 Universal
- Bronze
- not in the catalog
- Transform
- 4ort-mint · openalex:20260923 · version not recorded
🔖 Identifiers · 2
- ORCID iD
- 0000-0003-4512-2311
- OpenAlex ID
- A5091851475as of 2026-09-23
where from?
- Source
- OpenAlex
- Edition
- 20260923 · as of 2026-09-23
- Licence
- CC0 1.0 Universal
- Bronze
- not in the catalog
- Transform
- 4ort-mint · openalex:20260923 · version not recorded
📜 Data licence
Source: OpenAlex (openalex.org), snapshot of 2026-09-23. CC0 1.0 Universal. CC0 1.0 Universal · OpenAlex
🔗 Connections
Author of 5
Comparable Enhancement of TERS Signals from WSe<sub>2</sub> on Chromium and Gold,
Defect detection in atomic-resolution images via unsupervised learning with translational invariance,
Nanoscale Heterogeneities in Monolayer MoSe<sub>2</sub> Revealed by Correlated Scanning Probe Microscopy and Tip-Enhanced Raman Spectroscopy,
Spatially Resolved Band Gap and Dielectric Function in Two-Dimensional Materials from Electron Energy Loss Spectroscopy,
Transfer characteristics and low-frequency noise in single- and multi-layer MoS2 field-effect transistors
← Authored by 5
Comparable Enhancement of TERS Signals from WSe<sub>2</sub> on Chromium and Gold,
Defect detection in atomic-resolution images via unsupervised learning with translational invariance,
Nanoscale Heterogeneities in Monolayer MoSe<sub>2</sub> Revealed by Correlated Scanning Probe Microscopy and Tip-Enhanced Raman Spectroscopy,
Spatially Resolved Band Gap and Dielectric Function in Two-Dimensional Materials from Electron Energy Loss Spectroscopy,
Transfer characteristics and low-frequency noise in single- and multi-layer MoS2 field-effect transistors
Affiliated with 2
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Summary
Albert V. Davydov is a human[1].