A parameter estimation approach based on binary measurements using Maximum Likelihood analysis - Application to MEMS
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A parameter estimation approach based on binary measurements using Maximum Likelihood analysis - Application to MEMS is a scholarly article[1].
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A parameter estimation approach based on binary measurements using Maximum Likelihood analysis - Application to MEMS's instance of is recorded as scholarly article[2].
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APA4ort.xyz Knowledge Graph. (2026). A parameter estimation approach based on binary measurements using Maximum Likelihood analysis - Application to MEMS. Retrieved May 24, 2026, from https://4ort.xyz/entity/a-parameter-estimation-approach-based-on-binary-measurements-using-maximum-likelihood-analysis-application-to-mems
MLA“A parameter estimation approach based on binary measurements using Maximum Likelihood analysis - Application to MEMS.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/a-parameter-estimation-approach-based-on-binary-measurements-using-maximum-likelihood-analysis-application-to-mems.
BibTeX@misc{4ortxyz_a-parameter-estimation-approach-based-on-binary-measurements-using-maximum-likelihood-analysis-application-to-mems_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{A parameter estimation approach based on binary measurements using Maximum Likelihood analysis - Application to MEMS}}, year = {2026}, url = {https://4ort.xyz/entity/a-parameter-estimation-approach-based-on-binary-measurements-using-maximum-likelihood-analysis-application-to-mems}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): A parameter estimation approach based on binary measurements using Maximum Likelihood analysis - Application to MEMS — https://4ort.xyz/entity/a-parameter-estimation-approach-based-on-binary-measurements-using-maximum-likelihood-analysis-application-to-mems (retrieved 2026-05-24)
