A method for characterizing defects in multi-layer conductive structures by combining pulsed eddy current signals with PCA components

Research article (AIP conference proceedings, 2019) · cited 12× · AI/ML
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A method for characterizing defects in multi-layer conductive structures by combining pulsed eddy current signals with PCA components is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). A method for characterizing defects in multi-layer conductive structures by combining pulsed eddy current signals with PCA components. Retrieved October 18, 2026, from https://4ort.xyz/entity/a-method-for-characterizing-defects-in-multi-layer-conductive-structures-by-combining-pulsed-eddy-current-signals-with-p
MLA “A method for characterizing defects in multi-layer conductive structures by combining pulsed eddy current signals with PCA components.” 4ort.xyz Knowledge Graph, 4ort.xyz, 18 Oct. 2026, https://4ort.xyz/entity/a-method-for-characterizing-defects-in-multi-layer-conductive-structures-by-combining-pulsed-eddy-current-signals-with-p.
BibTeX @misc{4ortxyz_a-method-for-characterizing-defects-in-multi-layer-conductive-structures-by-combining-pulsed-eddy-current-signals-with-p_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{A method for characterizing defects in multi-layer conductive structures by combining pulsed eddy current signals with PCA components}}, year = {2026}, url = {https://4ort.xyz/entity/a-method-for-characterizing-defects-in-multi-layer-conductive-structures-by-combining-pulsed-eddy-current-signals-with-p}, note = {Accessed: 2026-10-18}}
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