A Line-Based-Clustering Approach for Ball Grid Array Component Inspection in Surface-Mount Technology

Research article (IEEE Transactions on Industrial Electronics, 2016) · cited 51× · AI/ML
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A Line-Based-Clustering Approach for Ball Grid Array Component Inspection in Surface-Mount Technology

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A Line-Based-Clustering Approach for Ball Grid Array Component Inspection in Surface-Mount Technology is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). A Line-Based-Clustering Approach for Ball Grid Array Component Inspection in Surface-Mount Technology. Retrieved May 24, 2026, from https://4ort.xyz/entity/a-line-based-clustering-approach-for-ball-grid-array-component-inspection-in-surface-mount-technology
MLA “A Line-Based-Clustering Approach for Ball Grid Array Component Inspection in Surface-Mount Technology.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/a-line-based-clustering-approach-for-ball-grid-array-component-inspection-in-surface-mount-technology.
BibTeX @misc{4ortxyz_a-line-based-clustering-approach-for-ball-grid-array-component-inspection-in-surface-mount-technology_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{A Line-Based-Clustering Approach for Ball Grid Array Component Inspection in Surface-Mount Technology}}, year = {2026}, url = {https://4ort.xyz/entity/a-line-based-clustering-approach-for-ball-grid-array-component-inspection-in-surface-mount-technology}, note = {Accessed: 2026-05-24}}
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