WaferSegClassNet - A light-weight network for classification and segmentation of semiconductor wafer defects

Research article (Computers in Industry, 2022) · cited 85× · AI/ML
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WaferSegClassNet - A light-weight network for classification and segmentation of semiconductor wafer defects

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WaferSegClassNet - A light-weight network for classification and segmentation of semiconductor wafer defects is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). WaferSegClassNet - A light-weight network for classification and segmentation of semiconductor wafer defects. Retrieved May 24, 2026, from https://4ort.xyz/entity/wafersegclassnet-a-light-weight-network-for-classification-and-segmentation-of-semiconductor-wafer-defects
MLA “WaferSegClassNet - A light-weight network for classification and segmentation of semiconductor wafer defects.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/wafersegclassnet-a-light-weight-network-for-classification-and-segmentation-of-semiconductor-wafer-defects.
BibTeX @misc{4ortxyz_wafersegclassnet-a-light-weight-network-for-classification-and-segmentation-of-semiconductor-wafer-defects_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{WaferSegClassNet - A light-weight network for classification and segmentation of semiconductor wafer defects}}, year = {2026}, url = {https://4ort.xyz/entity/wafersegclassnet-a-light-weight-network-for-classification-and-segmentation-of-semiconductor-wafer-defects}, note = {Accessed: 2026-05-24}}
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