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Wafer Surface Defect Detection Based On Improved YOLOv3 Network

Research article (2020 5th International Conference on Mechanical, Control and Computer Engineering (ICMCCE), 2020) · cited 10× · AI/ML
academia openalex:W3161825902
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Wafer Surface Defect Detection Based On Improved YOLOv3 Network

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Wafer Surface Defect Detection Based On Improved YOLOv3 Network is a scholarly article[1].

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  • Wafer Surface Defect Detection Based On Improved YOLOv3 Network's instance of is recorded as scholarly article[2].

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APA 4ort.xyz Knowledge Graph. (2026). Wafer Surface Defect Detection Based On Improved YOLOv3 Network. Retrieved May 24, 2026, from https://4ort.xyz/entity/wafer-surface-defect-detection-based-on-improved-yolov3-network
MLA “Wafer Surface Defect Detection Based On Improved YOLOv3 Network.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/wafer-surface-defect-detection-based-on-improved-yolov3-network.
BibTeX @misc{4ortxyz_wafer-surface-defect-detection-based-on-improved-yolov3-network_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Wafer Surface Defect Detection Based On Improved YOLOv3 Network}}, year = {2026}, url = {https://4ort.xyz/entity/wafer-surface-defect-detection-based-on-improved-yolov3-network}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Wafer Surface Defect Detection Based On Improved YOLOv3 Network — https://4ort.xyz/entity/wafer-surface-defect-detection-based-on-improved-yolov3-network (retrieved 2026-05-24)

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