Wafer map defect pattern classification based on convolutional neural network features and error-correcting output codes

Research article (Journal of Intelligent Manufacturing, 2020) · cited 67× · AI/ML
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Wafer map defect pattern classification based on convolutional neural network features and error-correcting output codes

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Wafer map defect pattern classification based on convolutional neural network features and error-correcting output codes is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Wafer map defect pattern classification based on convolutional neural network features and error-correcting output codes. Retrieved May 24, 2026, from https://4ort.xyz/entity/wafer-map-defect-pattern-classification-based-on-convolutional-neural-network-features-and-error-correcting-output-codes
MLA “Wafer map defect pattern classification based on convolutional neural network features and error-correcting output codes.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/wafer-map-defect-pattern-classification-based-on-convolutional-neural-network-features-and-error-correcting-output-codes.
BibTeX @misc{4ortxyz_wafer-map-defect-pattern-classification-based-on-convolutional-neural-network-features-and-error-correcting-output-codes_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Wafer map defect pattern classification based on convolutional neural network features and error-correcting output codes}}, year = {2026}, url = {https://4ort.xyz/entity/wafer-map-defect-pattern-classification-based-on-convolutional-neural-network-features-and-error-correcting-output-codes}, note = {Accessed: 2026-05-24}}
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