Wafer defect recognition method based on multi-scale feature fusion

Research article (Frontiers in Neuroscience, 2023) · cited 17× · AI/ML
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Wafer defect recognition method based on multi-scale feature fusion

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Wafer defect recognition method based on multi-scale feature fusion is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Wafer defect recognition method based on multi-scale feature fusion. Retrieved May 24, 2026, from https://4ort.xyz/entity/wafer-defect-recognition-method-based-on-multi-scale-feature-fusion
MLA “Wafer defect recognition method based on multi-scale feature fusion.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/wafer-defect-recognition-method-based-on-multi-scale-feature-fusion.
BibTeX @misc{4ortxyz_wafer-defect-recognition-method-based-on-multi-scale-feature-fusion_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Wafer defect recognition method based on multi-scale feature fusion}}, year = {2026}, url = {https://4ort.xyz/entity/wafer-defect-recognition-method-based-on-multi-scale-feature-fusion}, note = {Accessed: 2026-05-24}}
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