Wafer defect identification with optimal hyper-parameter tuning of support vector machine using the deep feature of ResNet 101

Research article (International Journal of Systems Assurance Engineering and Management, 2023) · cited 13× · AI/ML
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Wafer defect identification with optimal hyper-parameter tuning of support vector machine using the deep feature of ResNet 101

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Wafer defect identification with optimal hyper-parameter tuning of support vector machine using the deep feature of ResNet 101 is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Wafer defect identification with optimal hyper-parameter tuning of support vector machine using the deep feature of ResNet 101. Retrieved May 24, 2026, from https://4ort.xyz/entity/wafer-defect-identification-with-optimal-hyper-parameter-tuning-of-support-vector-machine-using-the-deep-feature-of-resn
MLA “Wafer defect identification with optimal hyper-parameter tuning of support vector machine using the deep feature of ResNet 101.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/wafer-defect-identification-with-optimal-hyper-parameter-tuning-of-support-vector-machine-using-the-deep-feature-of-resn.
BibTeX @misc{4ortxyz_wafer-defect-identification-with-optimal-hyper-parameter-tuning-of-support-vector-machine-using-the-deep-feature-of-resn_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Wafer defect identification with optimal hyper-parameter tuning of support vector machine using the deep feature of ResNet 101}}, year = {2026}, url = {https://4ort.xyz/entity/wafer-defect-identification-with-optimal-hyper-parameter-tuning-of-support-vector-machine-using-the-deep-feature-of-resn}, note = {Accessed: 2026-05-24}}
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