Use these citations when quoting this entity in research, articles, AI prompts, or wherever provenance matters. We aggregate Wikidata + Wikipedia + authoritative open-data sources; the stitched, scored, cross-referenced view is what 4ort.xyz contributes.
APA4ort.xyz Knowledge Graph. (2026). W-Band Noise Characterization with Back-Gate Effects for Advanced 22nm FDSOI mm-Wave MOSFETs. Retrieved May 24, 2026, from https://4ort.xyz/entity/w-band-noise-characterization-with-back-gate-effects-for-advanced-22nm-fdsoi-mm-wave-mosfets
MLA“W-Band Noise Characterization with Back-Gate Effects for Advanced 22nm FDSOI mm-Wave MOSFETs.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/w-band-noise-characterization-with-back-gate-effects-for-advanced-22nm-fdsoi-mm-wave-mosfets.
BibTeX@misc{4ortxyz_w-band-noise-characterization-with-back-gate-effects-for-advanced-22nm-fdsoi-mm-wave-mosfets_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{W-Band Noise Characterization with Back-Gate Effects for Advanced 22nm FDSOI mm-Wave MOSFETs}}, year = {2026}, url = {https://4ort.xyz/entity/w-band-noise-characterization-with-back-gate-effects-for-advanced-22nm-fdsoi-mm-wave-mosfets}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): W-Band Noise Characterization with Back-Gate Effects for Advanced 22nm FDSOI mm-Wave MOSFETs — https://4ort.xyz/entity/w-band-noise-characterization-with-back-gate-effects-for-advanced-22nm-fdsoi-mm-wave-mosfets (retrieved 2026-05-24)
