Unsupervised defect detection in textiles based on Fourier analysis and wavelet shrinkage

Research article (Applied Optics, 2015) · cited 83× · AI/ML
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Unsupervised defect detection in textiles based on Fourier analysis and wavelet shrinkage

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Unsupervised defect detection in textiles based on Fourier analysis and wavelet shrinkage is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Unsupervised defect detection in textiles based on Fourier analysis and wavelet shrinkage. Retrieved May 24, 2026, from https://4ort.xyz/entity/unsupervised-defect-detection-in-textiles-based-on-fourier-analysis-and-wavelet-shrinkage
MLA “Unsupervised defect detection in textiles based on Fourier analysis and wavelet shrinkage.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/unsupervised-defect-detection-in-textiles-based-on-fourier-analysis-and-wavelet-shrinkage.
BibTeX @misc{4ortxyz_unsupervised-defect-detection-in-textiles-based-on-fourier-analysis-and-wavelet-shrinkage_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Unsupervised defect detection in textiles based on Fourier analysis and wavelet shrinkage}}, year = {2026}, url = {https://4ort.xyz/entity/unsupervised-defect-detection-in-textiles-based-on-fourier-analysis-and-wavelet-shrinkage}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Unsupervised defect detection in textiles based on Fourier analysis and wavelet shrinkage — https://4ort.xyz/entity/unsupervised-defect-detection-in-textiles-based-on-fourier-analysis-and-wavelet-shrinkage (retrieved 2026-05-24)

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