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Total-Ionizing-Dose Effects and Low-Frequency Noise in 30-nm Gate-Length Bulk and SOI FinFETs With SiO<sub>2</sub>/HfO<sub>2</sub>Gate Dielectrics
Research article (IEEE Transactions on Nuclear Science, 2019) · cited 43× · AI/ML
Total-Ionizing-Dose Effects and Low-Frequency Noise in 30-nm Gate-Length Bulk and SOI FinFETs With SiO2/HfO2Gate Dielectrics
Summary
Total-Ionizing-Dose Effects and Low-Frequency Noise in 30-nm Gate-Length Bulk and SOI FinFETs With SiO2/HfO2Gate Dielectrics is a scholarly article[1].
Key Facts
Total-Ionizing-Dose Effects and Low-Frequency Noise in 30-nm Gate-Length Bulk and SOI FinFETs With SiO2/HfO2Gate Dielectrics's instance of is recorded as scholarly article[2].
References
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Use these citations when quoting this entity in research, articles, AI prompts, or wherever provenance matters. We aggregate Wikidata + Wikipedia + authoritative open-data sources; the stitched, scored, cross-referenced view is what 4ort.xyz contributes.
APA4ort.xyz Knowledge Graph. (2026). Total-Ionizing-Dose Effects and Low-Frequency Noise in 30-nm Gate-Length Bulk and SOI FinFETs With SiO<sub>2</sub>/HfO<sub>2</sub>Gate Dielectrics. Retrieved May 24, 2026, from https://4ort.xyz/entity/total-ionizing-dose-effects-and-low-frequency-noise-in-30-nm-gate-length-bulk-and-soi-finfets-with-sio-sub-2-sub-hfo-sub
MLA“Total-Ionizing-Dose Effects and Low-Frequency Noise in 30-nm Gate-Length Bulk and SOI FinFETs With SiO<sub>2</sub>/HfO<sub>2</sub>Gate Dielectrics.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/total-ionizing-dose-effects-and-low-frequency-noise-in-30-nm-gate-length-bulk-and-soi-finfets-with-sio-sub-2-sub-hfo-sub.
BibTeX@misc{4ortxyz_total-ionizing-dose-effects-and-low-frequency-noise-in-30-nm-gate-length-bulk-and-soi-finfets-with-sio-sub-2-sub-hfo-sub_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Total-Ionizing-Dose Effects and Low-Frequency Noise in 30-nm Gate-Length Bulk and SOI FinFETs With SiO<sub>2</sub>/HfO<sub>2</sub>Gate Dielectrics}}, year = {2026}, url = {https://4ort.xyz/entity/total-ionizing-dose-effects-and-low-frequency-noise-in-30-nm-gate-length-bulk-and-soi-finfets-with-sio-sub-2-sub-hfo-sub}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Total-Ionizing-Dose Effects and Low-Frequency Noise in 30-nm Gate-Length Bulk and SOI FinFETs With SiO<sub>2</sub>/HfO<sub>2</sub>Gate Dielectrics — https://4ort.xyz/entity/total-ionizing-dose-effects-and-low-frequency-noise-in-30-nm-gate-length-bulk-and-soi-finfets-with-sio-sub-2-sub-hfo-sub (retrieved 2026-05-24)
